DAHLGAARD, Jens J. <br/><br/>
From defect reduction to reduction of waste and customer/stakeholder satisfaction (understanding the new TQM metrology 

 - Oxfordshire :  Routledge,  December 2002 
<br/><br/> With the evolution of quality from inspection and defect reduction to the new management philosophy, TQM, a new quality metrology is needed. Contributions to buildings the new TQM Metrology in the form of principles, guidelines and examples are presented and discussed