| 000 | 00973naa a2200193uu 4500 | ||
|---|---|---|---|
| 001 | 10655 | ||
| 003 | OSt | ||
| 005 | 20190211155121.0 | ||
| 008 | 030131s2002 xx ||||gr |0|| 0 eng d | ||
| 100 | 1 |
_aDAHLGAARD, Jens J. _92661 |
|
| 245 | 1 | 0 | _aFrom defect reduction to reduction of waste and customer/stakeholder satisfaction (understanding the new TQM metrology |
| 260 |
_aOxfordshire : _bRoutledge, _cDecember 2002 |
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| 520 | 3 | _aWith the evolution of quality from inspection and defect reduction to the new management philosophy, TQM, a new quality metrology is needed. Contributions to buildings the new TQM Metrology in the form of principles, guidelines and examples are presented and discussed | |
| 700 | 1 |
_aDAHLGAARD, Su Mi Park _919633 |
|
| 773 | 0 | 8 |
_tTotal Quality Management _g13, 8, p. 1069-1085 _dOxfordshire : Routledge, December 2002 _xISSN 09544127 _w |
| 942 | _cS | ||
| 998 |
_a20030131 _bLucima _cLucimara |
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| 998 |
_a20101029 _b1150^b _cCarolina |
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| 999 |
_aConvertido do Formato PHL _bPHL2MARC21 1.1 _c10781 _d10781 |
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| 041 | _aeng | ||