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DAHLGAARD, Jens J.

From defect reduction to reduction of waste and customer/stakeholder satisfaction (understanding the new TQM metrology - Oxfordshire : Routledge, December 2002

With the evolution of quality from inspection and defect reduction to the new management philosophy, TQM, a new quality metrology is needed. Contributions to buildings the new TQM Metrology in the form of principles, guidelines and examples are presented and discussed

Escola Nacional de Administração Pública

Escola Nacional de Administração Pública

Endereço:

  • Biblioteca Graciliano Ramos
  • Funcionamento: segunda a sexta-feira, das 9h às 19h
  • +55 61 2020-3139 / biblioteca@enap.gov.br
  • SPO Área Especial 2-A
  • CEP 70610-900 - Brasília/DF
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