From defect reduction to reduction of waste and customer/stakeholder satisfaction (understanding the new TQM metrology
By: DAHLGAARD, Jens J
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Contributor(s): DAHLGAARD, Su Mi Park.
Material type: 
ArticlePublisher: Oxfordshire : Routledge, December 2002Total Quality Management 13, 8, p. 1069-1085Abstract: With the evolution of quality from inspection and defect reduction to the new management philosophy, TQM, a new quality metrology is needed. Contributions to buildings the new TQM Metrology in the form of principles, guidelines and examples are presented and discussed
| Item type | Current location | Collection | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Periódico | Biblioteca Graciliano Ramos | Periódico | Not for loan |
With the evolution of quality from inspection and defect reduction to the new management philosophy, TQM, a new quality metrology is needed. Contributions to buildings the new TQM Metrology in the form of principles, guidelines and examples are presented and discussed
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